HP 8568B Instrukcja Użytkownika

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Strona 1 - September 1993

Performance Tests andAdjustments ManualHP 8568B Spectrum AnalyzerHEWLETTPACKARDHP Part No. 08568-90118Printed in USASeptember 1993

Strona 2

Figuresl-l. Service Accessories, HP Part Number 08568-60001. .2-l. Center Frequency Accuracy Test Setup...2-2. Center Frequency Readout Error Mea

Strona 3 - Warranty

Test 9. RF GainUncertainty TestStep 6. 2nd LO ShiftMinMeasuredMax-1.0 dB+ 1.0 dB2-78 Performance Tests

Strona 4 - Assistance

Test 10. IF Gain Uncertainty TestTest 10. IF GainUncertainty TestStep 12. Step IF Gain Uncertainty, 10 dB Steps[REFERENCELEVEL]Wm)0-2-10-12-20-22-30 -

Strona 5 - General Safety

Test 10. IF Gain Uncertainty Test[REFERENCE LEVEL-Wm)Deviation(MKR AAmplitudeWV0.0-0.1-0.2-0.3-0.4-0.5-0.6-0.7-0.8-0.9-1.0-1.1-1.2-1.3-1.4-1.5-1.6-1.7

Strona 6 - Documentation

Test 10. IF Gain Uncertainty TestStep 23. Recorded deviations from Step 12.A BReference Level Range: 0 to -70 dBm -80 to -120 dBmLargest Positive Devi

Strona 7 - Contents

YLkst 11. Log ScaleSwitchingUncertainty TkstStep 6. Log Scale Switching UncertaintySCALE MKR Amplitude(dB/DIV)PW12510Deviation Allowable(WDeviation(W0

Strona 8 - Contents-2

Test 12. Amplitude Fidelity TestTest 12. AmplitudeFidelity ‘I&tStep 6. Log Amplitude Fidelity,Frequency12Fidelity ErrorSynthesizer CalibratedMARKE

Strona 9 - Contents-3

Test 13. AverageNoise Level Test2-84 Performance Tests

Strona 10 - Contents-4

Test 14. Residual Responses TestTest 14. ResidualResponses TestStep 11. Maximum Residual ResponseFrequencyRange500 Hz to 1500 MHzOption 400:500 Hz to

Strona 11

Tkst 15. SpuriousResponses Tkst2125263435DescriptionSecond HarmonicThird HarmonicThird Order Intermodulation Distortion30 MHz input signals, 1 MHz sep

Strona 12 - Contents-6

Test 16. Residual FM TestTest 16. ResidualFM TestStep 14. Residual FMIMinIMeasuredIrax]Performance Tests 2-87

Strona 13 - Contents-7

3-8. Location of AlA Components ...3-9. CRT Cut-Off Voltage3-10. Waveform at AlA3TP5’ : : : : : : : : : : : : : : :3-11. Discharging the CRT P

Strona 14

Tkst 17.Line-RelatedSidebands TestStep7120Hz (100Hz)180 Hz (150 Hz)240 Hz (200 Hz)7.Option 400 400 Hz800 Hz1200 HzMin1 Measured Max 1-85 dB-85 dB-85 d

Strona 15 - Information

Test 18. Calibrator Amplitude Accuracy TestTest 18. CalibratorAmplitudeAccuracy ‘I&tStep 2. CAL OUTPUT AmplitudeMinMeasured Max-10.3 dBm -9.70 dBm

Strona 16 - Option 857

Test 19. FastSweep TimeAccuracy Test (~20ms)Step 11. F&t Sweep Time Accuracy (~20 ms)[SWEEP TIME) Function Generator Frequency(kW5 ms 2.00 kO.022

Strona 17 - General Information 1-3

Test 20. 1st LO Output Amplitude TestTest 20. 1st LOOutput AmplitudeTestStep 4. 1st LO Output LevelPerformance Tests 2-91

Strona 18 - General Information

Test 21. FrequencyReference ErrorTestISteDDescriDtion1 Min 1 Measured 1 Max 14.Frequency (initial)10.MHz5.Frequency (after 24 hours)10. MHz6.Differenc

Strona 19

3AdjustmentsIntroductionThe procedures in this section are for the adjustment of theinstrument’s electrical performance characteristics.Warning The pr

Strona 20 - HP85662-60088

SafetyConsiderationsAlthough this instrument has been designed in accordance withinternational safety standards, this manual contains information,caut

Strona 21 - General Information

‘able 3-l. Adjustment Cross ReferenceFunction AdjustedLow VoltageHigh VoltageCRT Display (Standard)CRT Display (Digital Storage)IF GainsLog ScalesBand

Strona 22

RelatedAdjustmentsAny adjustments which interact with, or are related to, otheradjustments are indicated in the adjustments procedures. It isimportant

Strona 23 - Performance

‘Ihble 3-2. Adjustable ComponentsReferenceDesignatorAlA2C308AlA2R308AlA2R319AlA2R409AlA2R426AlA2R427AlA2R437AlA2R440AlA2R512AlA2R513AlA2R515AlA2R517Al

Strona 24 - Test Record

3-56. 20 MHz Reference Adjustments Setup ...3-57. Location of 20 MHz Reference Adjustments ...3-58. Typical Signal at A16TP3...3-59.

Strona 25 - Frequency Readout

‘Ihble 3-2. Adjustable Components (continued)ReferenceDesignatorA3AlR34AdjustmentNameSWEEP OFFSETAdjustmentNumber25Adjustment FunctionAdjusts digital

Strona 26

‘able 3-2. Adjustable Components (continued)ReferenceDesignatorA4A4C9AdjustmentNameSYMAdjustmentNumber8Adjustment FunctionA4A4C19LC CTR8A4A4C20CTR8A4A

Strona 27 - Performance Tests 2-5

Table 3-2. Adjustable Components (continued)ReferenceDesignatorA4A7C42A4A7R30AdjustmentNameCTR10 Hz AMPTDAdjustmentNumber77Adjustment FunctionCenters

Strona 28 - 2. Frequency Span

‘Ih.ble 3-2. Adjustable Components (continued)ReferenceDesignatorAGAlORlA6AlOR9A6AlOR12A6AlOR15A6AlOR18A6AlOR21A6AlOR23A6AlOR25A6AlOR27A6AlOR29A6AlOR3

Strona 29

‘Ihble 3-2. Adjustable Components (continued)ReferenceDesignatorA6A12R82A6A12R83A6A12R84A6A12R85A6A12R98A6A12R113A7A2C 1A7A2C2A7A2C3A7A2C4A7A4AlAlClA7

Strona 30 - 2-8 Performance Tests

‘lhble 3-2. Adjustable Components (continued)ReferenceAdjustment Adjustment Adjustment FunctionDesignator Name NumberAllA5ClIMPEDANCE16Optimizes sampl

Strona 31 - 3. Sweep Time

‘Ihble 3-2. Adjustable Components (continued)Reference Adjustment Adjustment Adjustment FunctionDesignatorNameNumberAlA2R31ORTHO3Sets orthogonality of

Strona 32 - Sweep Times 220 ms

‘Ihble 3-3. Factory-Selected ComponentsReferenceDesignatorAlA2R9A3AlR72A3A2R17A3A2R2 1A3A3C27A3A3C32A3A3R47A3A3R48A4AlRlOA4A 1 R67A4A2R18A4A2R22A4A2R2

Strona 33 - Performance Tests

l’hble 3-3. Factory-Selected Components (continued)ReferenceDesignatorA4A3R74A4A3R79A4A3R80A4A3R8 1A4A4ClOA4A4C17A4A4C38A4A4C66A4A4C70A4A4C92A4A4C97A4

Strona 34 - 2-12 Performance Tests

‘Ihble 3-3. Factory-Selected Components (continued)ReferenceDesignatorA4A7R13A4A7R23A4A7R24A4A7R34A4A7R35A4A7R45A4A7R46A4A7R56A4A7R57A4A7R60A4A7R66A4A

Strona 35 - 4. Resolution

6-7. IF Section, Bottom View . . . . . . . . . . . . . .6-10Contents-7

Strona 36 - 2-14 Performance Tests

Ifable 3-3. Fhctory-Selected Components (continued)ReferenceDesignatorA4A8R19A4A8R24A4A8R26A4A8R29A4A8R30A4A8R34A4A8R36A4A8R36A4A8R52A4A8R55A4A9R3A4A

Strona 37

‘Ihble 3-3. Factory-Selected Components (continued)ReferenceDesignatorA6A9AlR5AGASAlRlCA6A9AlR27A6AlOR86A6AlOR87A6AlOR88A6AlOR89A6AlOR90A6AlOR91A6Al l

Strona 38 - 2-16 Performance Tests

‘able 3-3. Factory-Selected Components (continued)Reference Adjustment Range of ValuesFunction of ComponentDesignator Procedure(0 or PF)Al lA4R24348 t

Strona 39 - Performance Tests 2-17

‘able 3-3. Factory-Selected Components (continued)Reference Adjustment Range of ValuesDesignator Procedure(0 or PF)Function of ComponentOption 462A4A7

Strona 40 - 6. Resolution

‘lkble 3-4. Standard Value Replacement CapacitorsrapaType: TubularRange: 1 to 24 pFfilerance: 1 to 9.1 pF = f0.25 pForsType: Dipped MicaRange: 27 to 6

Strona 41

‘lhble 3-5.Standard Value Replacement 0.125 ResistorsResistorsType: Fixed-FilmRange: 10 to 46413 OhmsWattage: 0.125 at 125’CTolerance: fl.O%Value (n)

Strona 42

‘Ihble 3-5.Standard Value Replacement 0.125 Resistors(continued)ResistorsType: Fixed-FilmRange: 10 to 464K OhmsWattage: 0.125 at 125°CValue (0)To1BP P

Strona 43 - Performance Tests 2-21

Table 3-6. Standard Value Replacement 0.5 ResistorsResistorsType: Fixed-FilmRange: 10 to 1.47M OhmsWattage: 0.5 at 125’CValue (fl)BP Part Number‘ant56

Strona 44 - Response Test

Ihble 3-6.Standard Value Replacement 0.5 Resistors(continued)ResistorsValue (0)16.2K17.8K19.6K21.5K23.7K26.lK28.7K31.6K34.8K38.31342.2K46.41351.1K56.2

Strona 45

1. Low-Voltage Power Supply Adjustments1. Low-VoltagePower SupplyAdjustmentsReference IF-Display Section:AlA f15 V RegulatorAlA + 120 V, +5.2 V Regula

Strona 46 - 2-24 Performance Tests

lhbles2-l. Performance Test Cross-Reference ...2-2. Center Frequency Readout Error Test Record ...2-3. Wide Span Error ...2-4.

Strona 47 - to 20 MHz

1. Low-Voltage Power Supply Adjustments4. Connect the DVM to AlA6TP3 on the IF-Display Section. DVMindication should be + 15.000 fO.O1O V dc. If the v

Strona 48

1. Low-Voltage Power Supply Adjustments7. Verify that the + 120 V indicator AlA7DS2 (yellow LED) is lit.NoteOn IF-Display Sections serial prefixed 300

Strona 49

1. Low-Voltage Power Supply Adjustmentssupply, therefore, if the +5V supply is out of tolerance, a circuitmalfunction is indicated.17. The -5V indicat

Strona 50 -

2. High-Voltage Adjustment (SN 3001A and Below)2. High-VoltageAdjustment (SN3001A and Below)NoteNoteReferenceDescriptionWarningThis procedure is for I

Strona 51 - CLEAR-WRITE)

2. High-Voltage Adjustment (SN 3001A and Below)DIGITIZINGOSCILLOSCOPEHI-VOLTAGESIGNAL ANALYZERFigure 3-5. High Voltage Adjustment SetupEquipmentDigita

Strona 52

2. High-Voltage Adjustment (SN 3001A and Below)NoteThe accuracy of the high-voltage probe is specified for a probeconnected to a dc voltmeter with 10

Strona 53

2. High-Voltage Adjustment (SN 3001A and Below)WarningWith the protective cover removed in the following step, do notplace hands near the AlA High-Vol

Strona 54 - 9. RF Gain Uncertainty Test

2. High-Voltage Adjustment (SN 3001A and Below)If the calibration factor calculated in step 8 is 0.00099, andAlA3Tl is labeled for -3875 V, then adjus

Strona 55 - 10. IF Gain

2. High-Voltage Adjustment (SN 3001A and Below)27. On the oscilloscope press [SHOW].28. Connect the oscilloscope channel 1 probe to AlA3TP5 using a l

Strona 56 - 10 dB Gain Steps

2. High-Voltage Adjustment (SN 3001A and Below)34. On the oscilloscope, adjust the channel 1 offset voltage asnecessary to measure the peak-to-peak CR

Strona 57 - Performance Tests 2-35

1General InformationIntroductionWarningInstruments Coveredby this ManualThis HP 8568B Tests and Adjustments Manual contains two sections:Performance T

Strona 58 - 2 dB Gain Steps

2. High-Voltage Adjustment (SN 3001A and Below)39. Slowly adjust the front-panel INTENSITY control through itsentire range while monitoring the peak-t

Strona 59 - 0.1 dB Gain Steps

2. High-Voltage Adjustment (SN 3001A and Below)AlA4, and AlA assemblies function properly and do not requirecompensation, proceed directly to adjustme

Strona 60 - 2.38 Performance Tests

2. High-Voltage Adjustment (SN 3001A and Below)5. While holding the insulated handle of the screwdriver, touch thegrounded blade to the following conn

Strona 61

2. High-Voltage Adjustment (SN 3004A and Above)2. High-VoltageAdjustment (SN3004A and Above)NoteThis procedure is for IF-Display Sections with serial

Strona 62

2. High-Voltage Adjustment (SN 3004A and Above)EquipmentHigh-VoltageAdjustment ProcedureWarningWarningDigital Voltmeter (DVM)...

Strona 63 - 12. Amplitude

2. High-Voltage Adjustment (SN 3004A and Above)AlA HIGH/VOLTAGEREGULATOR/AlABOSl- AlA7TP3- AlA6R103Figure 3-13. Location of High Voltage Adjustments4.

Strona 64 - 2-42 Performance Tests

2. High-Voltage Adjustment (SN 3004A and Above)11. Remove the protective cover from the AlA High-VoltageRegulator Assembly. A label should be visible

Strona 65 - Linear Fidelity

2. High-Voltage Adjustment (SN 3004A and Above)16. With the front-panel INTENSITY control fully counter clockwise,wait approximately 10 minutes to all

Strona 66 - 2-44 Performance Tests

2. High-Voltage Adjustment (SN 3004A and Above)3. Connect one end of a jumper wire (made of insulated wire andtwo alligator clips) to the blade of the

Strona 67 - 13. Average Noise

3. Preliminary Display Adjustments (SN 3001A and Below)3. PreliminaryDisplayAdjustments (SN3001A and Below)ReferenceAlAl KeyboardAlA Z-Axis AmplifierA

Strona 68 - 2-46 Performance Tests

Operation VerificationA high confidence level in the instrument’s operation can be achievedby running only the Operation Verification Program, since i

Strona 69 - 14. Residual

3. Preliminary Display Adjustments (SN 3001A and Below)ProcedureX and Y Deflection 1. Connect a 10:1 (10 MQ) divider probe to the oscilloscope’s chann

Strona 70

3. Preliminary Display Adjustments (SN 3001A and Below)A1A5,AlA4-AlA2’- A3A2Figure 3-17. Location of AlA2, AlA4, AlA5, and A3A2R22HF G(lN f f$GA I id“

Strona 72

3. Preliminary Display Adjustments (SN 3001A and Below)16. Three waveforms should be displayed on the oscilloscope, asshown in Figure 3-20. The lower

Strona 73 - Performance Tests 2-51

3. Preliminary Display Adjustments (SN 3001A and Below)19. Connect the oscilloscope’s channel 1 probe to AlA5El and thechannel 4 probe to AlA5E2. See

Strona 74 - Distortion

3. Preliminary Display Adjustments (SN 3001A and Below)28. Set the oscilloscope controls as follows:Press @iK]:Channel 1 . . . . . . . . . . . . . . .

Strona 75 - GENERAToRS

3. PreliminaryDisplayAdjustments (SN3004A and Above)ReferenceAlAl KeyboardAl A2 X, Y, Z Axis AmplifierNote Adjustment Procedure 2, “High-Voltage Adjus

Strona 76

3. Preliminary Display Adjustments (SN 3004A and Above)ProcedureX and Y Deflection1. Connect a 1O:l (10 MQ) divider probe to the oscilloscope’s channe

Strona 77 - Performance Tests 2-55

3. Preliminary Display Adjustments (SN 3004A and Above)AlAA3A2A3AlFigure 3-24. Location of AlA and A3A2TP5OlR127 P120 Cl09 TP105 R227c204R220R217J5GEI

Strona 78 - 16. Residual FM

3. Preliminary Display Adjustments (SN 3004A and Above)12. Set the oscilloscope controls as follows:Press[CHAN]:Channel 1...

Strona 79

‘Ihble l-l. Recommended Test Equipment (1 of 5)Critical Specifications forEquipment SubstitutionZecommendedModelFrequency: 10 MHz to 1500 MHzOutput Po

Strona 80 - 2-58 Performance Tests

3. Preliminary Display Adjustments (SN 3004A and Above)the combined X deflection voltage applied to the CRT. Use theoscilloscope’s front-panel knob to

Strona 81 - Performance Tests 2-59

19.20.Pulse Response of 21.Control Gate ZAmplifier to BLANKInput 22.23.24.Set the oscilloscope controls as follows:Note25.3. Preliminary Display Adjus

Strona 82 - Sidebands Tests

3. Preliminary Display Adjustments (SN 3004A and Above)29. Set the oscilloscope controls as follows:Press (CHAN]:Channel 1 . . . . . . . . . . onampli

Strona 83 - Performance Tests 2-61

4. Final Display Adjustments (SN 3001A and Below)4. Final DisplayAdjustments (SN3001A and Below)ReferenceDescriptionNoteProcedureNoteAlAl KeyboardAlA

Strona 84 - 18. Calibrator

4. Final Display Adjustments (SN 3001A and Below)5. For best overall focusing of the display, adjust the followingpotentiometers in the sequence liste

Strona 85 - Time Accuracy

4. Final Display Adjustments (SN 3004A and Above)4. Final DisplayAdjustments (SN3004A and Above)ReferenceDescriptionEquipmentProcedureNoteAlAl Keyboar

Strona 86 - [FREQUENCY SPAN) to 0 Hz

4. Final Display Adjustments (SN 3004A and Above)RI20R220R512R513R319R426R437Figure 3-32. Location of Final Display Adjustments on AlA‘Ihble 3-6. Init

Strona 87 - Performance Tests 2-65

8.9.10.11.4. Final Display Adjustments (SN 3004A and Above)For an initial coarse focus, adjust the following potentiometers inthe sequence listed:AlA3

Strona 88 - Amplitude Test

4. Final Display Adjustments (SN 3004A and Above)17. Adjust AlA2R512 ORTHO and the front-panel ALIGN controlto optimize the orientation and appearanc

Strona 89 - 21. Frequency

5. Log Amplifier Adjustments5. Log AmplifierAdjustmentsReferenceRelated PerformanceTestsNoteIF-Display SectionA4A3 Log Amplifier-FilterA4A2 Log Amplif

Strona 90

‘Ihble l-l. Recommended Test Equipment (2 of 5)InstrumentANALYZERSSpectrumAnalyzerSpectrumAnalyzerAC ProbeScalarNetworkAnalyzerDetector(2 required)COU

Strona 91

5. Log Amplifier Adjustments4. Connect DVM to A4AlTPl and DVM ground to the IF casting.Connect the frequency synthesizer to the RF INPUT. Key inCFREQU

Strona 92 - 1. Center

5. Log Amplifier AdjustmentsBandpass Filter Amplitude Adjustment9. Connect one end of a jumper wire to A4A3TP8. Connect theother end of the jumper to

Strona 93 - Span Accuracy Test

5. Log Amplifier Adjustments23. Decrease the frequency synthesizer’s output level 10 dB. PressCREFERENCE LEVEL) 0 dBm, and adjust the frequency synthe

Strona 94 - Test 3. Sweep

6. Video Processor Adjustments6. Video ProcessorAdjustmentsReferenceRelated PerformanceTestDescriptionIF-Display SectionA4A 1 Video ProcessorLog Scale

Strona 95 - ‘I&t 4. Resolution

6. Video Processor Adjustments6.7.8.9.10.11.12.13.14.15.16.Set step attenuator to 120 dB. DVM indication should be 0.000*0.0005 V dc. (If DVM indicati

Strona 96 - (VIDEOBW]

6. Video Processor Adjustments22. Decrease reference level to -70 dBm using the step key.23. DVM indication should be +0.200 l 0.002 V dc greater than

Strona 97 - 6. Resolution

7. 3 MHzBandwidth FilterAdjustmentsReferenceIF-Display SectionA4A7 3 MHz Bandwidth FilterRelated PerformanceResolution Bandwidth Switching Uncertainty

Strona 98 - Attenuator

Procedure 1.Position instrument upright as shown in Figure 3-37 and removetop cover.2.Set LINE switch to ON and press ~NSTR PRESET).7. 3 MHz Bandwidth

Strona 99 - 8. Frequency

7. 3 MHz Bandwidth Filter Adjustments10. Adjust A4A7C15 CTR for minimum amplitude of signal peak.Adjust A4A7C14 SYM for best symmetry. Repeat adjustme

Strona 100 - Uncertainty Test

7. 3 MHz Bandwidth Filter Adjustments25. Adjust A4A7C13 PK for maximum peak-to-peak signal on Channel2 display. See Figure 3-39 for location of adjust

Strona 102 - Performance Tests

7. 3 MHz Bandwidth Filter Adjustments10 Hz Amplitude Adjustments37.38.39.40.41.42.43.Connect CAL OUTPUT to RF INPUT. Key in [INSTR PRESET),[mj 9, (jEE

Strona 103 - Step 23

8. 21.4 MHz Bandwidth Filter Adjustments8. 21.4 MHzBandwidth FilterAdjustmentsReferenceRelated PerformanceTestsDescriptionIF-Display SectionA4A4 Bandw

Strona 104 - Uncertainty

8. 21.4 MHz Bandwidth Filter AdjustmentsEquipmentDigital Voltmeter (DVM) . . . . . . . . . . . . . . . . . . . . . . . .HP 3456A10 dB Step Attenuator.

Strona 105 - Fidelity ‘I&t

8. 21.4 MHz Bandwidth Filter Adjustments10. Key in CRESBW_) 1 MHz, and ISPAN) 1 MHz.11. Press MARKER CPEAK SEARCH], MARKER a.12. Key in CREsBW) 100 kH

Strona 106 - Noise Level Test

8. 21.4 MHz Bandwidth Filter Adjustments22. Adjust A4A4C73 CTR to center signal on center graticule line.Adjust A4A4C65 SYM for best symmetry of signa

Strona 107 - Responses Test

8. 21.4 MHz Bandwidth Filter Adjustments33. Key in t-1 100 kHz, C-1 200 kHz, and MARKER[PEAK SEARCH].34. Adjust A4A8R35 LC to align makers on display.

Strona 108 - Responses

8. 21.4 MHz Bandwidth Filter Adjustments45.LC46.47.48.49.50.51.52.53.54.55.56.57.58.59.60.61.Adjust A4ABR40 XTAL to align markers on display. MARKERA

Strona 109 - Test 16. Residual

62.63.64.65.66.67.8. 21.4 MHz Bandwidth Filter Adjustmentsapproximately -17 kHz (to the left). If unable to achieve a “dip”in signal amplitude, increa

Strona 110 - Sidebands Test

9. 3 dB BandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionIF-Display SectionA4A9 IF ControlResolution Bandwidth Accuracy TestThe CAL OUTP

Strona 111 - Accuracy ‘I&t

9. 3 dB Bandwidth AdjustmentsA4A9IF CONTROL\Figure 3-45. Locationof 3dB Bandwidth AdjustmentsA4A39. Press MARKER a. Adjust marker to 3 dB point on opp

Strona 112

@Copyright Hewlett-Packard Company 1993All Rights Reserved. Reproduction, adaptation, or translation withoutprior written permission is prohibited, ex

Strona 113 - Output Amplitude

‘Ihble l-l. Recommended Test Equipment (4 of 5)InstrumentATTENUATORS(Cont’d)20 dBAttenuatorTERMINATIONSTerminationFIWERSLow-PassFilterLow-PassFilterLo

Strona 114 - Reference Error

9. 3 dB Bandwidth Adjustments22. CRT MKR A annotation now indicates the 3 dB bandwidth of the300 kHz bandwidth. 3 dB bandwidth should be 300.0 f30.0 k

Strona 115 - Warning

10. Step Gain and 18.4 MHz Local Oscillator Adjustments10. Step Gain and18.4 MHz LocalOscillatorAdjustmentsReferenceRelated PerformanceTestsDescriptio

Strona 116 - Adjustment Tools

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsEquipmentDigital Voltmeter (DVM)... HP 3456APower Meter...

Strona 117 - Components

10. Step Gain and 18.4 MHz Local Oscillator Adjustments10. If A4A5R33 CAL adjustment does not have sufficient range toadjust trace to the top CRT grat

Strona 118 - 3-4 Adjustments

10. Step Gain and 18.4 MHz Local Oscillator Adjustments1 dB Gain Step Checks22. Key in [REFERENCE LEVEL) -19.9 dBm. Set step attenuators to 15dB. Pres

Strona 119 - Adjustments 3-5

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsA4A5 STEP GAINR2Cl0 FREOR51+lOV ADJRlO ZERO COARSE C9 “RA4A5Figure 3-49.Location of .l dB Gain

Strona 120

11. Down/UpConverterAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureIF-Display SectionA4A6 Down/Up ConverterResolution Bandwid

Strona 121 - Adjustments 3-7

11. Down/Up Converter Adjustments6. Adjust A4A6AlR29 WIDE GAIN to align markers on CRT display.MKR A level should indicate 1.00 X. See Figure 3-51 fo

Strona 122 - 3-8 Adjustments

11. Down/Up Converter AdjustmentsDown Converter GainAdjustmentNoteIf a gain problem is suspected in the 10 Hz to 1 kHz resolutionbandwidths, perform t

Strona 123 - Adjustments 3-9

12. Time Base Adjustment (SN 2840A and Below, also 3217A05568 and Above)12. Time BaseAdjustment (SN2840A and Below,also 3217AO5568and Above)Reference

Strona 124 - Adjustments

‘Ihble l-l. Recommended Test Equipment (5 of 5)Instrument Critical Specifications for Recommended Perf. Adj aEquipment Substitution ModelTestCABLESCab

Strona 125 - Adjustments 3-11

12. Time Base Adjustment (SN 2840A and Below, also 3217A05568 and Above)ProcedureNoteThe spectrum analyzer must be ON continuously (not in STANDBY) f

Strona 126 - 3-12 Adjustments

12. Time Base Adjustment (SN 2840A and Below, also 3217A05568 and Above)6. Set the Frequency Counter controls as follows:INPUT. . . . . . . . . . . .

Strona 127 - Adjustments 3-13

12. Time Base Adjustment (SN 2840A and Below, also 3217A05568 and Above)14.15.16.Reading 11:mHzSubtract the shifted frequency reading in step 11 from

Strona 128 - 3-14 Adjustments

12. Time Base Adjustment (SN 2848A to 3217A05567)12. Time BaseAdjustment (SN2848A to3217A05567)ReferenceRelated PerformanceTestDescriptionEquipmentPro

Strona 129 - Adjustments 3-15

12. Time Base Adjustment (SN 2848A to 3217A05567)The A27A2 10 MHz Quartz Crystal Oscillator (HP P/N 1081 l-601 11)typically reaches its specified agin

Strona 130

12. Time Base Adjustment (SN 2848A to 3217A05567)INT/EXT switch (rear panel) . . . . . . . . . . . . . . . . . . . . . EXT7. On the Frequency Counter,

Strona 131 - Adjustments 3-17

12. Time Base Adjustment (SN 2848A to 3217A05567)15. On the Frequency Counter, select a 1 second gate time bypressing, t-1 1 @Y%YiK]. The Frequency Co

Strona 132 - 3-18 Adjustments

13. 20 MHz Reference Adjustments13. 20 MHzReferenceAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentRF Section:Al6 20 MHz ReferenceCalib

Strona 133 - Adjustments 3-19

13. 20 MHz Reference AdjustmentsProcedure1. Position instrument on right side as shown in Figure 3-56 andremove bottom cover. Remove Al6 20 MHz Refere

Strona 134

13. 20 MHz Reference Adjustments8566AB Spectrum Analyzer (CENTER FREQUENCY_) to 20.34 MHz andSCALE to 10 dB/division.10. Adjust Al6 20.34 MHz NULL A16

Strona 135 - Adjustments 3-21

DescriptionExtenderBoard:20contacts;2rowsof10Cable: 4-foot long; BNC to SMB snap-onPC Board: Display Adjustment TestExtenderBoard:30contacts;2rowsof15

Strona 136 - 3-22 Adjustments

13. 20 MHz Reference AdjustmentsPress &K?@Press CnTavj:AVmarkers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ..onVmarker 1.

Strona 137 - Adjustments 3-23

14. 249 MHz Phase Lock Oscillator Adjustments14. 249 MHz PhaseLock OscillatorAdjustmentsReferenceDescriptionEquipmentRF Section:A7 249 MHz Phase Lock

Strona 138 - 3-24 Adjustments

14. 249 MHz Phase Lock Oscillator AdjustmentsProcedure 1.Place instrument on right side with IF-Display Section facing rightas shown in Figure 3-59.2.

Strona 139 - Adjustments

15.16.17.18.19.20.14. 249 MHz Phase Lock Oscillator AdjustmentsSet LINE switch to STANDBY. Adjust A7L2 one-half turncounterclockwise before placing A7

Strona 141 - RF Section

15. 275 MHz Phase Lock Oscillator AdjustmentA18 275 MHzPHASE LOCK OSCILLATOR-10-UI1C8 PLO,ADJUSTA18Figure 3-62. Location of 275 MHz PLO Adjustment7. D

Strona 142 - 3-28 Adjustments

16. Second IFAmplifier andThird ConverterAdjustmentReferenceRF Section:A19 Second IF AmplifierA20 Third ConverterDescriptionA synthesized sweeper is u

Strona 143 - Description

ProcedureSecond IF AmplifierAdjustments16. Second IF Amplifier and Third Converter AdjustmentAdapters:Type N (f) to APC-3.5 (f) . . . . . . . . . . .

Strona 144 - Adjustment Procedure

16. Second IF Amplifier and Third Converter Adjustment14.15.16.17.See Figure 3-65 for the typical response when the bandpass filteris properly adjuste

Strona 145 - Adjustments 3-3 1

16. Second IF Amplifier and Third Converter AdjustmentNotePlace the Markers as accurately as possible within the cursor markersfor maximum frequency a

Strona 146 - EXAMPLE:

2Performance TkstsIntroductionThe procedures in this section test the instrument’s electricalperformance using the Specifications in the Installation

Strona 147 - Focus and Intensity

16. Second IF Amplifier and Third Converter Adjustment17. Pilot Second IFAmplif’ierAdjustmentsReferenceRF Section:A9 Pilot Second IF AmplifierA10 Pilo

Strona 148 - 3-34 Adjustments

17. Pilot Second IF Amplifier AdjustmentsProcedure1. Position instrument on right side as shown in Figure 3-67, withbottom cover removed.2. Set LINE s

Strona 149 - 60.00 v

17. Pilot Second IF Amplifier AdjustmentsA9 PILOTA10 PILOT2ND IF AMPLIFIER3RD CONVERTER\ I/269MHz BANDPASS FILTERFigure 3-68.Location of 269 MHz Bandp

Strona 150 - 3-36 Adjustments

18. Frequency Control Adjustments18. FrequencyControlAdjustmentsReferenceRelated PerformanceTestsDescriptionEquipmentProcedureRF Section:A22 Frequency

Strona 151 - Adjustments 3-37

18. Frequency Control AdjustmentsA22FREOUENCY CONTROLSTARTFM SPANSTOPTILTYTO-SD VT0TlJNE REFREFFASTA22Figure 3-71. Location of Frequency Control Adjus

Strona 152 - 3-38 Adjustments

18. Frequency Control AdjustmentsFull Sweep11. Repeat Start-Up Time Measurement procedure in step 8 and step 9Adjustmentfor (SWEEP TIME) of 20 ms. Not

Strona 153

18. Frequency Control AdjustmentsSTART and STOPAdjustmentsFM SPAN Adjustment30.22.23.Key in (ml [CF STEP SIZE) J 1023 Hz.Adjust A22 LSD VT0 A22R7 for

Strona 154

19. Second Converter Adjustments19. SecondConverterAdjustmentsReferenceRF Section:A23 RF ConverterRelated PerformanceRF Gain Uncertainty TestTestSpuri

Strona 155 - Adjustments 3-41

19. Second Converter AdjustmentsProcedureSecond LO Frequency3. Set HP 8568B Spectrum Analyzer LINE to ON and pressand Shift Adjustments(JNSTR PRESET].

Strona 156

19. Second Converter Adjustments9. Readjust A23A3 2ND MIXER A23A3Z4 for maximum powerindication.10. Disconnect the amplifier’s input from A23A3J3 and

Strona 157 - Discharge Procedure

Equipment Required Equipment required for the manual performance tests andadjustments is listed in ‘Ihble 2-1, Recommended Test Equipment,at the begin

Strona 158 - 3-44 Adjustments

19. Second Converter AdjustmentsSecond Converter27. Key in m (JJ) T, [FREQUENCY SPAN] 0 Hz.Bandpass FilterAdjustments28. On the synthesized sweeper, k

Strona 159 - 3001A and Below)

19. Second Converter AdjustmentsFigure 3-74. Typical PILOT 2ND IF Bandpass (SHIFT t)Figure 3-75. Typical PILOT 2ND IF Bandpass (SHIFT 1)42. Key in [*]

Strona 160 - Response Adjustments

19. Second Converter Adjustments48. Disconnect cable connected to A23A3J2 and connect to A23A3Jl(1ST IF IN). Reconnect semi-rigid cable to A23A3J2 tha

Strona 161 - ~000uu000000u00ur

19. Second Converter AdjustmentsSecond Converter53. Repeat steps 14 through 19 to ensure that Second LO frequencyFinal Adjustmentsand shift are still

Strona 162

20. 50 MHzVoltage-TunedOscillatorAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureRF Section:All 50 MHz Voltage-Tuned Oscillato

Strona 163

20. 50 MHz Voltage-Tuned Oscillator AdjustmentsDACS Accuracy Check3. Connect DVM to A22TP9 and ground lead to A22TP12.4. Key in [SHIFT) [CF STEP SIZE]

Strona 164 - Amplifier to BLANK

20. 50 MHz Voltage-Tuned Oscillator Adjustments14. Adjust All POS SUPPLY AllR6 for a DVM indication the same asthat noted in step 12. See Figure 3-79

Strona 165 - 45.00 v

2 1. Slope Compensation Adjustments21. SlopeCompensationAdjustmentsReferenceRF Section:A22 Frequency ControlRelated PerformanceTestFrequency Response

Strona 166 - 3004A and Above)

2 1. Slope Compensation AdjustmentsProcedure1. Place instrument on right side as show in Figure 3-80, and removebottom cover.2. Connect equipment as s

Strona 167

21. Slope Compensation AdjustmentsNoteAt this sweep time, some trace discontinuities are common.14. Adjust A22R66 TILT for best flatness (clockwise ro

Strona 168 - 3-54 Adjustments

1. Center Frequency Readout Accuracy Test1. CenterFrequency ReadoutAccuracy ‘I&tRelated AdjustmentsSpecification(uncorrected)DescriptionFrequency

Strona 169

22. CombGeneratorAdjustmentsReferenceRF Section:A23 RF ConverterAl6 20 MHz ReferenceDescriptionThe output of the Pilot First Converter is connected to

Strona 170

22. Comb Generator AdjustmentsEquipmentCable, SMA (m) to SMA (m) . . . . . . . . . . . . . . . HP 85680-20094Procedure 1.2.3.4.5.6.7.8.9.10.11.12.13.S

Strona 171 - Input 22

22. Comb Generator Adjustmentsa typical comb tooth display. See Figure 3-83 for location ofadjustments.14. The majority of the comb teeth should be ab

Strona 172 - 3-58 Adjustments

23. Analog-To-Digital Converter Adjustments23.Analog-To-DigitalConverterAdjustmentsReferenceDescriptionEquipmentA3A8 Analog-to-Digital ConverterThe An

Strona 173

23. Analog-To-Digital Converter AdjustmentsProcedure 1. Position instrument upright as shown in Figure 3-85 and removetop cover.2. Set LINE switch to

Strona 174

23. Analog-To-Digital Converter Adjustments1. Adjust A3A8R5 GAIN for a square wave displayed on theoscilloscope. The square wave should be approximate

Strona 175 - 4. Final Display

24. Track and HoldAdjustmentsReferenceA3A9 Track and HoldDescription The CAL OUTPUT signal is connected to the RF INPUT. Theinstrument is placed in ze

Strona 176 - 3-62 Adjustments

24. Track and Hold AdjustmentsA6AS ~EOM4LR ESA6A9AlRllCAL ADJII10.11.TRIFc29RI1‘LER MATCH CAL OUTPUTRlOA6A9AlFigure 3-88. Location of Track and Hold A

Strona 177 - Adjustments 3-63

24. Track and Hold Adjustments24. Adjust A3A9R52 GNEG for MARKER A level indication asindicated by CRT annotation of 100 ho.1 dB.25. Repeat steps 4 th

Strona 178 - 3-64 Adjustments

25. Digital Storage Display Adjustments25. Digital StorageDisplayAdjustmentsReferenceDescriptionEquipmentProcedurePreliminary GraticuleAdjustmentsA3A

Strona 179 - 5. Log Amplifier

1. Center Frequency Readout Accuracy TestEquipmentSynthesized Sweeper . . . . . . . . . HP 8340AFrequency Standard . 10 MHz standard, accy within + 1

Strona 180 - 5. Adjust

25.DigitalStorage Display AdjustmentsA-IA?A3A3A3AlINTENSITYLINETRIGGER CONTROLGENERATOR!12R51R50-HRESH Y 8 & H BALX S & H BAIA3A2A3A3R34SWP OF

Strona 181

25. Digital Storage Display AdjustmentsSample and Hold13. Set LINE switch to STANDBY.Balance Adjustments14. Place A3A3 Line Generator on extender boar

Strona 182 - 3.66 Adjustments

25. Digital Storage Display Adjustments20.21.22.23.24.Set LINE switch to ON.X and Y Offset and 25.Gain Adjustments 26,27.Press (INSTR PRESET).Key in [

Strona 183 - 6. Video Processor

25. Digital Storage Display Adjustments41. Adjust A3A3R5 Y GAIN to align the top graticule line with thefast sweep signal trace.Final Graticule42. Pre

Strona 184

Low-Noise DCThe Low-Noise DC Supply shown in Figure 3-93 can be constructedSUPPlYusing the parts listed in ‘Ikble 3-7.Figure 3-93. Low-Noise DC Supply

Strona 185 - Adjustments 3-7 1

Crystal Filter Bypass Network ConfigurationCrystal FilterBypass NetworkConfigurationThe Crystal Filter Bypass Network Configuration shown in Figure 3-

Strona 186 - Related Performance

Option 462IntroductionThis chapter contains modified performance tests and adjustmentprocedures for Option 462 instruments. When working on Option462

Strona 187

4. 6 dB ResolutionBandwidthAccuracy TestRelated AdjustmentSpecificationDescriptionEquipmentProcedure6 dB Bandwidth Adjustments&20%, 3 MHz bandwidt

Strona 189 - Adjustments 3-75

4. Impulse andResolutionBandwidthAccuracy TestRelated Adjustment Impulse Bandwidth AdjustmentsSpecification*20%, 3 MHz bandwidthflO%, 1 MHz to 1 kHz b

Strona 190 - 3-76 Adjustments

1. Center Frequency Readout Accuracy TestNoteSpectrum analyzer center frequency readout can fall outside ofspecified limits if 10 MHz frequency refere

Strona 192

4. Impulse and Resolution Bandwidth Accuracy Test17.18.19.20.21.22.23.24.25.26.27.28.29.30.31.32.Tl to 30 kHz. On theSet the frequency synthesizer (FR

Strona 194

4. Impulse and Resolution Bandwidth Accuracy TestNote 6 dB resolution bandwidth measurements are used in PerformanceTest 5, Impulse and Resolution Ban

Strona 195 - Adjustments 3-81

4. Impulse and Resolution Bandwidth Accuracy Test‘Ihble 4-3. 6 dB Resolution Bandwidth AccuracyResBW3 MHz (i)1 MHz (i)300 kHz (i)100 kHz (i)30 kHz (i)

Strona 196 - 3-82 Adjustments

5. 6 dB ResolutionBandwidthSelectivity TestRelated AdjustmentsSpecificationDescriptionEquipmentNoteProcedure3 MHz Bandwidth Filter Adjustments21.4 MHz

Strona 197 - A level should indicate 0.00

7.8.9.10.rp105. 6 dB Resolution Bandwidth Selectivity TestVary spectrum analyzer settings according to Table 4-4. PressSWEEP @KZF] and measure the 60

Strona 198 - Bandwidth

5. 6 dB Resolution Bandwidth Selectivity Test‘Ikble 4-4. 6 dB Resolution Bandwidth Selectivityr3 MHz1 MHz300 kHz100 kHz30 kHz10 kHz3 kHz1 kHz300 Hz100

Strona 200

5. Impulse and Resolution Bandwidth Selectivity TestHKR P ieREF 0.0 aBmAl-TEN 10 d0-0.10 aw4.04 HHZ30 a0//\I.Figure 4-5. 60 dB Bandwidth Measurement4.

Strona 201

2. Frequency SpanAccuracy lkstRelated AdjustmentsFrequency Control Adjustments50 MHz Voltage-Tuned Oscillator AdjustmentsSpecificationSpan>l MHz51

Strona 202

5. Impulse and Resolution Bandwidth Selectivity Test‘Ihble 4-5. Impulse and Resolution Bandwidth SelectivitySpectrum AnalyzerMeasured Measured Bandwid

Strona 203 - Adjustments 3-89

6. Impulse andResolutionBandwidthSwitchingUncertainty TkstRelated AdjustmentSpecificationDescriptionEquipmentProcedure3 MHz Bandwidth Filter Adjustmen

Strona 204

6. Impulse and Resolution Bandwidth Switching Uncertainty TestMKR A 0 HZrpREF53.0 d0mATTEN 10 d80.00 dBIII I IIIIIIIldB’ t-H+I I I I I I I\MAR <ER

Strona 205 - Adjustments 3-91

Test 4. 6 dBResolutionBandwidthAccuracy Test (p/o‘lhble 2-19,Performance TestRecord)‘RES)3MHz1MHz300kHz100kHz30kHz10kHz3kHz1kHz300Hz100Hz30Hz10HzStep

Strona 206 - Converter

@ai--3MHz(i)1MHz(i)300kHz(i)100kHz(i)30kHz(i)10kHz(i)3kHz(i)1kHz(i)3MHz3MHz3MHz1MHz300kHz100kHz30kHz10kHzTest 4. Impulse and Resolution Bandwidth Accu

Strona 207 - Optional

Test 4. Impulse and Resolution Bandwidth Accuracy Test (p/o ‘Ihble 2-19, Performance Test Record)Steps 39 through 46. 6 dB Resolution BandwidthAccurac

Strona 208 - Adjustment

Test 5. 6 dB Resolution Bandwidth Selectivity (p/o lkble 2-19, Performance Test Record)Test 5. 6 dBResolutionBandwidthSelectivity (p/o‘lhble 2-19,Perf

Strona 209

Test 5. Impulseand ResolutionBandwidthSelectivity (p/oI)dble 2-19,Performance T&tRecord)Steps 5 through 9. Impulse and Resolution BandwidthSelecti

Strona 210

Test 6. Impulse and Resolution Bandwidth Switching Uncertainty (p/o ‘Ikble 2-19, Performace Test Record)-‘l&t 6. Impulseand ResolutionBandwidthSwi

Strona 211

9. 6 dB ResolutionBandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureIF-Display SectionA4A9 IF Control6 dB Resolution Ba

Strona 212 - 3-98 Adjustments

EquipmentProcedureSpectrunFrequent y&an200HzIOOkHz100.1 kHz1MHz1.01 MHz20MHz20.1 MHz1.5 GHzAnalyzerCenterFrequent y100MHz100MHz100MHz100MHz100MHz1

Strona 213 - 3217A05567)

9. 6 dB Resolution Bandwidth Adjustments13. Using the DATA knob, adjust the marker down one side of thedisplay signal to the 6 dB point; CRT MKR A ann

Strona 214 - (CLEAR-WRITE)

9. 6 dB Resolution Bandwidth Adjustments24.25.26.27.28.29.30.31.32.33.34.Press MARKER IOFF), then MARKER In].Using the DATA knob, adjust the marker do

Strona 215 - MATH (SELECT/ENTER]

9. Impulse Bandwidth Adjustments9. ImpulseBandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureIF-Display SectionA4A9 IF C

Strona 216 - 3-102 Adjustments

9. Impulse Bandwidth Adjustments13. Using the DATA knob, adjust the marker down one side ofthe display signal to the 7.3 dB point; CRT MKR A annotatio

Strona 217

9. Impulse Bandwidth Adjustments[REFERENCE LEVEL] and using the DATA knob to place the signalpeak near the top of the graticule.24. Press MARKER IOFF)

Strona 218

5Option 857IntroductionThis chapter contains a modified performance test for Option 857instruments. When working on Option 857 instruments, substitute

Strona 219

12. Option 857Amplitude FidelityTestRelated AdjustmentLog Amplifier AdjustmentsSpecificationLog:IncrementalfO.l dB/dB over 0 to 80 dB displayCumulativ

Strona 220

12. Option 857 Amplitude Fidelity TestEquipment Frequency Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 3335AAda

Strona 221

12. Option 857 AmplitudeFidelity Test‘Ikble 5-1. Log Amplitude Fidelity (10 Hz RBW; Option 857)Frequency 1 2 Fidelity Error CumulativeCumulativeSynthe

Strona 222

12. Option 857 Amplitude Fidelity TestFrequency1SynthesizerCalibratedAmplitudeAmplitude(dBm)Step+lO0 (ref)0-10-10 -20-20 -30-30 -40-40 -50-50-60-60-70

Strona 223 - Adjustments 3-l 09

CertificationHewlett-Packard Company certifies that this product met itspublished specifications at the time of shipment from the factory.Hewlett-Pack

Strona 224

2. Frequency Span Accuracy TestFreq Spanr-1 1.5 GHz-34,500.OOO Hz ] 34,500O.OOO Hz‘Ihble 2-4. Span Error-I-SDan ErrorADUT-ASynfrom ‘Ihble 2-3-ISpec.M

Strona 225

12. Option 857 Amplitude Fidelity Test‘lhble 5-3. Linear Amplitude FidelityFrequency MARKER AAllowable RangeSynthesizer Amplitude (413% of Reference L

Strona 226

Performance TestRecordHewlett-Packard CompanyModel HP 8568BSerial No.IF-Display SectionRF SectionTested byReport No.DateOption 857 5-7

Strona 227 - Second IF Amplifier

Test 12. Option857 AmplitudeFidelity TestStep 9. Log Amplitude Fidelity (10 Bz RBW; Option 857)Frequency1SynthesizerCalibratedAmplitudeAmplitudeWWStep

Strona 228 - 3-114 Adjustments

Test 12. Option 857 Amplitude Fidelity TestStep 26. Linear Amplitude FidelityFrequency MARKER AAllowable RangeSynthesizer Amplitude (1t3% of Reference

Strona 229 - Third Converter

6Major Assembly and Component LocationsIF-Display SectionFigure IndexAssemblySee FigureAlAl...6-6AlA...

Strona 230

W24...6-7W25...6-7W26...

Strona 231

A26F2...6-3A26F3 ...6-3A26F4 ...

Strona 232

w43/cc5c4c3c2Figure 6-l. RF Section, Top ViewA266-4Major Assembly and Component locations

Strona 233 - 18. Frequency

423A2w14 w3w43w31427ASAA543W2 45A2A5A 1A5AlJl W42A5Rl( INPUT SELECT)(KEYBOARD)Figure 6-2. RF Section, Front ViewMajor Assembly and Component locations

Strona 234 - Slow Sweep

A26Fl F2 F3 F4 F5-15v-5v+2ov +5v1 5A3A1 .5A6A+;I$0102040305UlIWI4A5i4 A?4 A533 AiAl 1d9A5’J 1AiSlFigure 6-3. RF Section, Bottom View6-6Major Assembly

Strona 235 - DACS 1023.)

3. Sweep Time Accuracy Test (220 ms)3. Sweep TimeAccuracy Test (220ms)Related AdjustmentFrequency Control AdjustmentsSpecification*lo% for sweep times

Strona 236 - FM SPAN Adjustment

AlAlOC2AlAlOC3AlAW7w21AlAAIAI 1W6w21AlAAlVlAlAFigure6-4. IF Section, Top View (SN 3001A and Below)AlAlOClAlAlOC4 \AlA AlA A\.\ \ I‘ir8AlAFLiAITIA4A9A4

Strona 237

AlAlOClAlAlOC4AlAlOC2AlAlOC3w21AlAAlVlAlAAlAAlA AlAlASFl 1AITIA4A3A4A8A4A7A4A6A4A5A4A4A4A3A4A2A4Ali ‘A3Al0>00Figure 6-5. IF Section, Top View (SN 3

Strona 238 - Second LO Frequency

AlVlFigure 6-6. IF Section, Front View,w3w9Major Assembly and Component locations6-9

Strona 239 - Adjustments 3-125

AlAlOI /’ AAA4AlOW8A3AlO/ IW24w23Figure 6-7. IF Section, Bottom View/w2g/W24/W28‘W23‘W32(SN 3004Aand above)\AlVl6-10Major Assembly and Component locat

Strona 240 - Bandpass

3. Sweep Time Accuracy Test (220 ms)EquipmentUniversal Counter ...HP 5316ADigital Voltmeter...

Strona 241 - Adjustments 3-127

3. Sweep Time Accuracy Test (220 ms)NOTE:PULSE WIDTH APPROXIMATE+15v-r-lt-SWEEP RETRACErlJIt-ACTIVE SNEEP +ov- ---1 L---START+TI”ESTOPhEINTERVALINTERV

Strona 242 - 3-128 Adjustments

3. Sweep Time Accuracy Test (220 ms)‘Ihble 2-6.Sweep Time Accuracy, Sweep Times 220 s[SWEEP TIME) Marker A TimeMin Measured Max20 s 3.6 s 4.4 s200 s 3

Strona 243 - Final Adjustments

4. Resolution Bandwidth Accuracy Test4. ResolutionBandwidthAccuracy TestRelated AdjustmentSpecificationDescriptionEquipmentProcedure(For instruments w

Strona 244 - Oscillator

4. Resolution Bandwidth Accuracy TestFigure 2-6. Resolution Bandwidth Measurement8. Vary spectrum analyzer settings according to ‘fable 2-8. Measureth

Strona 246

5. Resolution Bandwidth Selectivity Test6. Read the 60 dB bandwidth for the 3 MHz resolution bandwidthsetting from the MARKER A frequency readout (see

Strona 247

5. Resolution Bandwidth Selectivity Test‘lhble 2-9. Resolution Bandwidth SelectivitySpectrum Analyzer Measured Measured Bandwidth MaximumRES] (FREQUEN

Strona 248

AssistanceProduct maintenance agreements and other customer assistanceagreements are available for Hewlett-Rwkard products.Fbr any assistance, contact

Strona 249 - Adjustments 3-135

6. ResolutionBandwidthSwitchingUncertainty TestRelated AdjustmentsSpecificationDescriptionEquipmentProcedure(For instruments with Option 462, refer to

Strona 250

6. Resolution Bandwidth Switching Uncertainty TestFigure 2-8. Bandwidth Switching Uncertainty Measurement‘Ihble 2-10. Bandwidth Switching Uncertainty1

Strona 252 - 3-138 Adjustments

7. Input Attenuator Switching Uncertainty Test6. Press MARKER CPEAK SEARCH),(KJ7. Set [~~J’JREFERENCE LEVEL], and frequency synthesizeramplitude accor

Strona 253

8. FrequencyResponse TestRelated AdjustmentSpecificationDescriptionSYNTHESIZED SWEEPERSlope Compensation AdjustmentSIGNAL INPUT 1~tl.5 dB, 100 Hz to 1

Strona 254 - Standard Procedure

8. Frequency Response TestNoteEquipment listed is for three test setups, Figure 2-11, Figure 2-13, andFigure 2-15.EquipmentSynthesized Sweeper ...

Strona 255 - Alternate Procedure

8. Frequency Response Test7.8.9.Key in the following spectrum analyzer settings:10.Press TRACE A [MAX) on the analyzer.11.Press SWEEP SINGLE on the sy

Strona 256

8. Frequency Response TestOption 001: Set [REFERENCE LEVEL] TO -6.0 dBm.15. Repeat steps 6 through 11. Press DISPLAY LINE [ENTER) on thespectrum analy

Strona 258 - 3-144 Adjustments

8. Frequency Response Test25. After completion of sweep, press DISPLAY LINE (j?KiK] on thespectrum analyzer. Use the Display Line to measure the maxim

Strona 259 - 25. Digital Storage

Safety SymbolsCautionWarningThe following safety symbols are used throughout this manual.Familiarize yourself with each of the symbols and its meaning

Strona 260 - 3-146 Adjustments

8. Frequency Response Test100Hzto100kHz 32.33.34.35.36.37.38.39.40.41.Press (INSTR PRESET) on the spectrum analyzer. Activate SIGNALINPUT 1.Key in the

Strona 261 - 0.000 v

8. Frequency Response Test42. Press DISPLAY LINE [ENTER] on the spectrum analyzer. Use theDisplay Line to measure the maximum and minimum points onthe

Strona 262 - Gain Adjustments

8. Frequency Response Test49. For each input, subtract the lowest minimum level (greatestnegative) from the highest maximum (least negative)measuremen

Strona 264 - Low-Noise DC

9. RF Gain Uncertainty Testh/I1 II\ I-Figure 2-16. RF Gain Uncertainty Measurement2-32 Performance Tests

Strona 265 - Configuration

10. IF Gain Uncertainty Test10. IF GainUncertainty TestRelated AdjustmentsStep Gain and 18.4 MHz Local Oscillator Adjustments21.4 MHz Bandwidth Filter

Strona 266

10. IF Gain Uncertainty TestEquipment Frequency Synthesizer...HP 3335AAdapter, Type N (m) to BNC (f)...

Strona 267 - Accuracy Test

10. IF Gain Uncertainty Test‘Ihble 2-12. IF Gain Uncertainty, 10 dB Steps[REFERENCE LEVEL)Pm)0-10-20-30-40-50-60-70-80 -32-90-42-100-52-110-62-120-72F

Strona 268

10. IF Gain Uncertainty Test2 dB Gain Steps13. Press QNSTR pREsETj,(jRECALL) 7.14. Set [REFERENCE LEVEL] to -1.9 dBm.15. Press MARKER (OFF). Set CVlD

Strona 269 - Accuracy

10. IF Gain Uncertainty Test0.1 dB Gain Steps19. Set [REFERENCE LEVEL) to 0 dB.20. Set the frequency synthesizer for an output power level of -2.00dBm

Strona 270

HP 8568BSpectrum AnalyzerDocumentationOutlineHP 8568B Installationand VerificationManualHP 8568B Operatingand ProgrammingManualHP 8568BPerformance Tes

Strona 271 - Option 462

10. IF Gain Uncertainty Test‘Ihble 2-14. IF Gain Uncertainty, 0.1 dB Steps[REFERENCE LEVEL) Frequency DeviationPm)Synthesizer (MKR AAmplitude Amplitu

Strona 273 - 4-8 Option 462

11. Log Scale Switching Uncertainty TestHKA 100.001 B MHZHKA 100.001 B MHZbbREP -9.8 dmlREP -9.8 dmlATTEN 10 deATTEN 10 dB-a.a2 *em-a.a2 *em2 dB/2 dB/

Strona 274 - Option 462 4-9

12. Amplitude Fidelity Test12. AmplitudeFidelity Test(For instruments with Option 857, refer to Chapter 5.)Related AdjustmentLog Amplifier Adjustments

Strona 275 - Selectivity Test

12. Amplitude Fidelity TestEquipment Frequency Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 3335AAdapter, Type

Strona 276

12. Amplitude Fidelity Test8. The fidelity error for amplitude steps from -10 dB to -80 dBshould be <& 1.0 dB.9. The fidelity error at the -90

Strona 277 - 4-12 Option 462

12. Amplitude Fidelity Test‘Ihble 2-17. Linear Amplitude FidelityFrequency MARKER A Allowable RangeSynthesizer Amplitude (f3 % of Reference Level)Amp

Strona 278

13. Average Noise Level Test13. Average NoiseLevel TkstSpecificationDescriptionEquipmentProcedurec-135 dBm for frequencies >I MHz, c-112 dBm for fr

Strona 279

13. Average Noise Level TestFigure 2-23. Average Noise Level Measurement9. Read the average noise level from the DISPLAY LINE readout.The value should

Strona 280

14. Residual Responses Test14. ResidualResponses TestSpecificationDescriptionEquipmentProcedurec-105 dBm for frequencies >500 Hz with 0 dB input at

Strona 281 - Specification

Contents1. General InformationIntroduction...Instruments Covered by this Manual...Operation Verification...Option

Strona 282 - I I I I I I I

14. Residual Responses Test9.10.11.Figure 2-24. Residual Responses MeasurementPress SWEEP [SINGLE_) and wait for completion of sweep. Look forany resi

Strona 283 - 4-18 Option 462

15. Spurious Responses Test15. SpuriousResponses TestRelated AdjustmentSecond Converter AdjustmentsSpecificationFor total signal power of c-40 dBm at

Strona 284 - Option 462 4-19

15. Spurious Responses TestSPECTRUM ANALYZERSYNTHESIZED SMEEPEA10 DBATTENUATOR300 MHZLPFJFigure 2-25. Harmonic Distortion Test SetupNoteEquipment list

Strona 285 - 4-20 Option 462

15. Spurious Responses Testsignal for a marker indication of -20.00 dBm (-30.0 dBm at theinput mixer with 10 dBm of input attenuation).6On the spectru

Strona 286 - Option 462 4-21

15. Spurious Responses TestIntermodulationDistortionSPECTRUM ANALYZERATTENUATORATTENUATORDIRECTIONAL50 MHz LONPASS FILTERFigure 2-26. Intermodulation

Strona 287 - 4-22 Option 462

15. Spurious Responses Test-0-10-20zEi.i-30z3 -40Q2-50-60-70NoteIf unable to locate intermodulation distortion products, temporarilyincrease output po

Strona 288 - Option 462 4-23

15. Spurious Responses Test24. On the frequency synthesizer, readjust the signal amplitude asnecessary to position the peak of the displayed 29.99 MHz

Strona 289

15. Spurious Responses Test35. On the spectrum analyzer, key in [CENTER FREQUENCY] 59 MHz,MARKER [PEAK SEARCH) to position a second marker at the peak

Strona 290 - Option 462 4-25

16. Residual FMTestSpecification<3 Hz peak-to-peak in 110 s; frequency span ~100 kHz, resolutionbandwidth 530 Hz, video bandwidth 530 Hz.Descriptio

Strona 291 - A indication of 1.5 kHz while

16. Residual FM TesthrRF -I... L1uFigure 2-28. Bandwidth Filter Slope Measurement8. Compute the detection slope of the 30 Hz filter between themarkers

Strona 292 - 9. Impulse

3.Test 11. Log Scale Switching Uncertainty Test...Test 12. Amplitude Fidelity Test...Test 13. Average Noise Level Test...Test 14. Resi

Strona 293 - A indication of 150 kHz while

16. Residual FM TestFigure 2-29. Slope Detected Residual FM11. Press SWEEP CRINGLE) and wait for completion of the sweep.12. Press MARKER [PEAK SEARCH

Strona 294 - A annotation indicates 1.00

16. Residual FM Test13. Press MARKER Ia] and position movable marker at the lowestpoint on the trace (see Figure 2-30). Read the MARKER Aamplitude fro

Strona 295

17. Line-RelatedSidebands TestsSpecification95 dB below the peak of a CW signal. Option $00: >75 dB belowthe peak of a CW signal.Description The sp

Strona 296 - Amplitude Fidelity

Option 400 1.2.3.Press ONSTR PRESET).4.Key in the following analyzer settings:5.6.7.17. Line-Related Sidebands TestsFigure 2-31. Line Related Sideband

Strona 297

18. CalibratorAmplitudeAccuracy TestRelated Adjustment20 MHz Reference AdjustmentsSpecification-10 dBm f0.3 dBDescriptionThe output level of the calib

Strona 298 - 5-4 Option 857

19. Fast Sweep Time Accuracy Test (~20 ms)19. Fast SweepTime AccuracyTest (430 ms)Related Adjustment NoneSpecification&lo% for sweep times 5100 se

Strona 299 - Option 857 5-5

19. Fast Sweep Time Accuracy Test (~20 ms)5. Press MARKER (PEAK SEARCHJ@~EFZF),~.6. Set [FREQUENCY SPAN) to 0 Hz, (j-1 to 3 MHz, [VlDEoBW) to 3MHz, an

Strona 300 - 5-6 Option 857

19. Fast Sweep Time Accuracy Test (~20 ms)‘able 2-18. Fast Sweep Time Accuracy (~20 ms)[SWEEP TIME] Function Generator Frequency Sweep Time Errorww(di

Strona 301 - Performance Test

20. 1st LO OutputAmplitude TestSpecification>+4 dBm from 2.0 GHz to 3.7 GHzDescription The power level at the 1ST LO OUTPUT connected is measured a

Strona 302 - Fidelity Test

21. Frequency Reference Error Test21. FrequencyReference ErrorTestRelated Adjustment Time Base AdjustmentSpecification Aging Rate<l x 10eg/day and

Strona 303 - Option 857 5-9

Crystal Filter Bypass Network Configuration . . . . . 3-1514. Option 462Introduction . . . . . . . . . . . . . . . . . . . . .4-l4. 6 dB Resolution Ba

Strona 305 - RF Section Figure

‘lhble 2-19.Performance TkstRecordHewlett-Packard CompanyModel HP 8568BSerial No.IF-Display SectionRF SectionTested byReport No.DatePerformance Tests

Strona 306

Tkst 1. CenterFrequency ReadoutAccuracy TestStep 8. Center Frequency Readout Error Test RecordCombSpectrum AnalyzerGeneratorCombFrequencyWW[FREQUENCY

Strona 307 - RF Section, Top View

Test 2. Frequency Span Accuracy Test‘I&t 2. FrequencySpan Accuracy Testrn,1SpectrumkequencySpan200 Hz100kHz100.1 kHzIMHz1.01 MHz20 MHz20.1 MHz1.5

Strona 308

Test 3. SweepTime AccuracyStep 6. Sweep Time Accuracy, Sweep Times 220 ms[SWEEP TIME)Marker A TimeMinMeasuredMax20 ms18ms 22 ms50 ms45ms 55 ms100 ms90

Strona 309

Test 4. Resolution Bandwidth Accuracy‘I&t 4. ResolutionBandwidthAccuracyStep 8. Bandwidth Accuracy/[REW-3MHz1MHz300kHz100kHz30kHz10kHz3kHz1kHz300H

Strona 310

Test 5. ResolutionBandwidthSelectivitySteps 7, 8 and 9. Resolution Bandwidth SelectivitySpectrum Analyler Measured(RES] [FREQUHKYWANJ(VIDEOBW]60 dBBan

Strona 311 - and Above)

Test 6. Resolution Bandwidth Switching Uncertainty Testlkst 6. ResolutionBandwidthSwitchingUncertainty TestStep 6. Bandwidth Switching Uncertainty1 MH

Strona 312

Test 7. InputAttenuatorSwitchingUncertainty Test10203040506070Step 7. Input Attenuator Switching Uncertainty(REFERENCE LEVEL]ww-50-40-30-20-100+lOFreq

Strona 313

Test 8. Frequency Response TestTest 8. FrequencyResponsg&kep12151625263142484950Signal InputSIGNAL INPUT 2(20 MHz to 1.5 GHz)SIGNAL INPUT 1(20 MHz

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